Hello All,
I'm trying to implement ECC self-tests as described in System datasheet ( https://www.renesas.com/us/en/doc/products/mpumcu/doc/rz/r01uh0751ej0100-rzn1-system.pdf ) on 4.5.4 Self-Testing of the ECC Circuit (4MB SRAM).
I've successfully implemented the self-tests for 2MB SRAM, but with the 4MB one I'm having an issue with the SR4DBEST register, that it doesn't react to reading of variable with injected double-bit error. Other registers such as SR4DBEAD and SR4DBECNT are reacting correctly on each read of the infected variable and I'm receiving IRQs as expected.
The datasheet doesn't concretely specify how the test variables should be placed in the memory, if there is some spacing required between them or anything (there is just 128-bit alignment mentioned), so I tried my best to write them as I perceive them.
I've attached the stripped-down version of Baremetal example project from renesas, where I added my code for the ECC tests (+ some porting functions/defined).
It can be run on the RZ/N1L-DB test board or any other board (you just may not see the debug messages, but that's not needed). Does anyone know what I'm missing here?